Pubblicazioni

Measurement of Dielectric Loss in Silicon Nitride at Centimeter and Millimeter Wavelengths

2023 - IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY

Pan, Z.; Barry, P. S.; Cecil, T.; Albert, C.; Bender, A. N.; Chang, C. L.; Gualtieri, R.; Hood, J.; Li, J.; Zhang, J.; Lisovenko, M.; Novosad, V.; Wang, G.; Yefremenko, V.