Pubblicazioni

Progressive vs. abrupt reset behavior in conductive bridging devices: A C-AFM tomography study

2015 - Technical Digest - International Electron Devices Meeting, IEDM

Celano, U.; Goux, L.; Belmonte, A.; Giammaria, G.; Opsomer, K.; Detavernier, C.; Richard, O.; Bender, H.; IRRERA, Fernanda; Jurczak, M.; Vandervorst, W.