Pubblicazioni

Through-silicon-trench in back-side-illuminated CMOS image sensors for the improvement of gate oxide long term performance

2019 - Technical Digest - International Electron Devices Meeting, IEDM

Vici, A.; Russo, F.; Lovisi, N.; Latessa, L.; Marchioni, A.; Casella, A.; Irrera, F.

Current harmonic losses resulting from first and second generation LED lights replacement with sodium vapor lights in a LV feeder

2017 - Conference Proceedings - 2017 17th IEEE International Conference on Environment and Electrical Engineering and 2017 1st IEEE Industrial and Commercial Power Systems Europe, EEEIC / I and CPS Europe 2017

Noshahr, Javad Behkesh; Meykhosh, Masoud Hamedi; Kermani, Mostafa