Pubblicazioni

Electrical characterization of FIB processed metal layers for reliable conductive-AFM on ZnO microstructures

2016 - APPLIED SURFACE SCIENCE
Pea, M.; Maiolo, L.; Giovine, E.; Rinaldi, A.; Araneo, Rodolfo; Notargiacomo, Andrea

A route for reliable conductive scanning probe characterization of FIB machined ZnO nanopillars

2015 - IEEE-NANO 2015 - 15th International Conference on Nanotechnology
Pea, M.; Notargiacomo, Andrea; Giovine, E.; Araneo, Rodolfo; Rinaldi, A.; Maiolo, L.

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