Pubblicazioni

Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations

2016 - JOURNAL OF COMPUTATIONAL ELECTRONICS
Abbas, Zia; Olivieri, Mauro; Ripp, Andreas

Optimal NBTI degradation and PVT variation resistant device sizing in a full adder cell

2015 - Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), 2015 4th International Conference on
ABBAS, ZIA; OLIVIERI, Mauro; KHALID, USMAN; Ripp, Andreas; Pronath, Michael

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