Pubblicazioni

Strained Silicon Technology: Non-Destructive High-Lateral-Resolution Characterization Through Tip-Enhanced Raman Spectroscopy

2024 - APPLIED SPECTROSCOPY
LA PENNA, Giancarlo; Mancini, Chiara; Proietti, Anacleto; Buccini, Luca; Passeri, Daniele; Gambacorti, Narciso; Richy, Jérôme; Rossi, Marco

Theoretical and Practical Considerations of Spatially Offset Raman Spectroscopy (SORS) and Micro-SORS

2024 - APPLIED SPECTROSCOPY
Lux, A.; Conti, C.; Botteon, A.; Mosca, S.; Matousek, P.

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