Pubblicazioni

Comparison of Gabay-Toulouse and de Almeida-Thouless instabilities for the spin-glass XY model in a field on sparse random graphs

2018 - PHYSICAL REVIEW. B

Lupo, Cosimo; Ricci-Tersenghi, Federico

Unusually large chemical potential shift in a degenerate semiconductor: Angle-resolved photoemission study of SnSe and Na-doped SnSe

2018 - PHYSICAL REVIEW. B

Maeda, M.; Yamamoto, K.; Mizokawa, T.; Saini, N. L.; Arita, M.; Namatame, H.; Taniguchi, M.; Tan, G.; Zhao, L. D.; Kanatzidis, M. G.

Anomalous metallic state with strong charge fluctuations in BaxTi8 O16+Î´ revealed by hard x-ray photoemission spectroscopy

2018 - PHYSICAL REVIEW. B

Dash, S.; Kajita, T.; Okawa, M.; Saitoh, T.; Ikenaga, E.; Saini, N. L.; Katsufuji, T.; Mizokawa, T.

Infrared study of the quasi-two-dimensional electron system at the interface between SrTiO3and crystalline or amorphous LaAlO3

2018 - PHYSICAL REVIEW. B

Nucara, A.; Corasaniti, M.; Kalaboukhov, A.; Ortolani, M.; Falsetti, E.; Sambri, A.; Miletto Granozio, F.; Capitani, F.; Brubach, J. -B.; Roy, P.; Schade, U.; Calvani, P.

Temperature-dependent local structure and superconductivity of BaPd2As2 and SrPd2As2

2018 - PHYSICAL REVIEW. B

Terashima, K.; Paris, E.; Simonelli, L.; Salas-Colera, E.; Puri, A.; Wakita, T.; Yamada, Y.; Nakano, S.; Idei, H.; Kudo, K.; Nohara, M.; Muraoka, Y.; Mizokawa, T.; Yokoya, T.; Saini, N. L.

Emergent Dirac carriers across a pressure-induced Lifshitz transition in black phosphorus

2018 - PHYSICAL REVIEW. B

Di Pietro, P.; Mitrano, M.; Caramazza, S.; Capitani, F.; Lupi, S.; Postorino, P.; Ripanti, F.; Joseph, B.; Ehlen, N.; GrÃ¼neis, A.; Sanna, A.; Profeta, G.; Dore, P.; Perucchi, A.

Out-of-equilibrium dynamics driven by localized time-dependent perturbations at quantum phase transitions

2018 - PHYSICAL REVIEW. B

Pelissetto, Andrea; Rossini, Davide; Vicari, Ettore

Orbital-dependent band renormalization in WT e2 revealed by angle-resolved photoemission spectroscopy

2018 - PHYSICAL REVIEW. B

Matsumoto, R.; Sugimoto, T.; Mizokawa, T.; Saini, N. L.; Arita, M.; Jha, R.; Higashinaka, R.; Matsuda, T. D.; Aoki, Y.