interfaces

XPS LotusLab

English

• XPS hemispherical electron analyser: VG Microtech Clam-2, pass-energy range: 10-200 eV, single-channel detector;
• XPS photon source: PSP double-anode X-ray source, emission lines AlKα (1486.6 eV) MgKα (1253.6 eV);
• XPS UHV manipulator: 4-degrees of freedom, cryostat (>77 K), electron-bombardment heater (≤1200 K);
• Low-Energy Electron Diffraction (LEED): Omicron SpectaLEED system, with LEED and Auger modules;
• Ion Gun: Omicron ISE10 0.2-5 keV energy range, Ar ion source;

Well-posedness of two pseudo-parabolic problems for electrical conduction in heterogeneous media

We prove a well-posedness result for two pseudo-parabolic problems, which can be seen as two models for the same electrical conduction phenomenon in heterogeneous media, neglecting the magnetic field. One of the problems is the concentration limit of the other one, when the thickness of the dielectric inclusions goes to zero. The concentrated problem involves a transmission condition through
interfaces, which is mediated by a suitable Laplace-Beltrami type equation.

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