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Risultati ricerca pubblicazioni

Risultati ricerca pubblicazioni

A measurement-based analysis of temperature variations introduced by power management on Commodity HardWare

pubblicato su: Proc. 19th International Conference on Transparent Optical Networks (ICTON) - 2017

Blefari Melazzi Nicola, Canali Claudia, Cuomo Francesca, Lancellotti Riccardo, Shojafar Mohammad

Univariate power analysis attacks exploiting static dissipation of nanometer CMOS VLSI circuits for cryptographic applications

pubblicato su: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING - 2017

Bellizia Davide, Bongiovanni Simone, Monsurro' Pietro, Trifiletti Alessandro, Scotti Giuseppe

Novel measurements setup for attacks exploiting static power using DC pico-ammeter

pubblicato su: 2017 European Conference on Circuit Theory and Design (ECCTD) - 2017

Bellizia Davide, Cellucci Danilo, Di Stefano Valerio, Scotti Giuseppe, Trifiletti Alessandro

CATALOGO IRIS SAPIENZA

Anno

2017 (3) Apply 2017 filter

Tipo pubblicazione

04 Pubblicazione in atti di convegno (2) Apply 04 Pubblicazione in atti di convegno filter
01 Pubblicazione su rivista (1) Apply 01 Pubblicazione su rivista filter

Rivista

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING (1) Apply IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING filter

Book

2017 European Conference on Circuit Theory and Design (ECCTD) (1) Apply 2017 European Conference on Circuit Theory and Design (ECCTD) filter
Proc. 19th International Conference on Transparent Optical Networks (ICTON) (1) Apply Proc. 19th International Conference on Transparent Optical Networks (ICTON) filter

Keywords

(-) Remove power demand filter power demand
cryptography (2) Apply cryptography filter
nanometer CMOS (2) Apply nanometer CMOS filter
power measurement (2) Apply power measurement filter
attack exploiting static power (1) Apply attack exploiting static power filter
cameras (1) Apply cameras filter
CMOS integrated circuits (1) Apply CMOS integrated circuits filter
CMOS technology (1) Apply CMOS technology filter
cryptographic circuits (1) Apply cryptographic circuits filter
current measurement (1) Apply current measurement filter
leakage power analysis (1) Apply leakage power analysis filter
logic gates (1) Apply logic gates filter
meters (1) Apply meters filter
power analysis attacks (1) Apply power analysis attacks filter
random access memory (1) Apply random access memory filter
semiconductor device modeling (1) Apply semiconductor device modeling filter
servers (1) Apply servers filter
side channel attack (1) Apply side channel attack filter
side-channel attacks (1) Apply side-channel attacks filter
signal to noise ratio (1) Apply signal to noise ratio filter
standards (1) Apply standards filter
Static current (1) Apply Static current filter
static power (1) Apply static power filter
temperature control (1) Apply temperature control filter
temperature measurement (1) Apply temperature measurement filter

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