Conductive layer modeling by improved Second-Order artificial material single layer method
An improved second order artificial material single layer (AMSL) method is proposed to predict the electromagnetic field in presence of conductive thin layers by the finite element method (FEM). The AMSL method is based on the replacement of the material physical constants of a conductive shield region with those of an artificial material. The new AMSL physical constants are analytically extracted by equating the equivalent transmission line (TL) equations governing the field propagation inside the shield with the FEM solution.