Ricerc@Sapienza

This paper deals with the extension of the artificial material single-layer (AMSL) method, recently developed to model electromagnetically a thin conductive material using the finite-element method (FEM), to the more general case of transversally anisotropic shields. The analogy between the field equations and the multiconductor transmission line (MTL) equations is here used to calculate the admittance matrix of a thin anisotropic material. This admittance matrix is then imposed to be that of an equivalent circuit with lumped parameters.

A new artificial material single layer (AMSL) model is presented to solve shielding problem. The field penetration through the conductive shield is described by lossy transmission line equations. The resulting equations are used to numerically synthetize an equivalent material for the shield region having the same geometrical configuration of the original shield, but different specific constants.

The artificial material single-layer (AMSL) method, recently proposed to model solid conductive shields in finite-element solvers without using a fine discretization, is here extended to model multilayer shields. First, the admittance matrix of a multilayer shield is analytically derived by the transmission line (TL) theory. Then, considering that the field through conductive shields propagates normally to the shield surface, the TL admittance matrix is equated to that of a 1-D finite element to extract the physical constants of a homogenized artificial material.