Ricerc@Sapienza

CMOS technology has been extensively used for the realization of image sensors at Terahertz frequencies. The explanation of its strong efficiency was usually given invoking a mechanism described by the plasma wave detection theory. This model predicts that, when a high frequency potential is applied between gate and source electrodes of a MOSFET, oscillations of the 2D electron gas, located in the inversion layer, converts THz radiation into a DC voltage.

In this paper, a new model of the frequency dependence of the double-barrier THz rectifier is presented. The new structure is of interest because it can be realized by CMOS image sensor technology. Its application in a complex field such as that of THz receivers requires the availability of an analytical model, which is reliable and able to highlight the dependence on the parameters of the physical structure. The model is based on the hydrodynamic semiconductor equations, solved in the small signal approximation.