PFM characterization of piezoelectric PVDF/ZnONanorod thin films

04 Pubblicazione in atti di convegno
Cavallini D., Fortunato M., De Bellis Giovanni, Sarto M. S.

The present work reports the development and the piezoelectric characterization of nano-engineered thin-films of Polyvinylidene Fluoride (PVDF) and vertical array of zinc oxide nanorods (ZnO-NRs). In particular, the piezoelectric response of the produced samples was investigated by evaluating the piezoelectric coefficient (d33), through Piezoresponse Force Microscopy (PFM). We compared the piezoelectric response of three different samples: a neat PVDF thin-film, an array of vertically oriented ZnO-NRs and an array of vertically oriented ZnO-NRs embedded in PVDF. We tested two types of substrates: a flexible substrate namely PET-ITO and a rigid substrate namely ITO coated glass. The highest piezoelectric response was found to be exerted by the hybrid system made of vertically aligned ZnO-NRs array embedded in PVDF on PET-ITO substrate, showing a piezoelectric coefficient, as high as 14.91 pm/V.

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