Magnetic Force Microscopy
Magnetic force microscopy (MFM) refers to a family of scanning probe techniques
based on atomic force microscopy (AFM), which allow one to image the magnetic
properties of the sample surface at the nanoscale, simultaneously to its topography.
Here, we review the most widespread MFM techniques, mainly dynamic MFM
although static MFM is also briefly described for the sake of completeness. We
illustrate the working principles, the experimental setups, and the analytical models
describing the MFM response, which are fundamental for understanding and quantitatively
interpreting the contrast in MFM images. An overview is given of the
application fields of MFM, which cover almost all the magnetic materials, from
recording media to ferromagnetic materials, nanomaterials and nanoparticles, alone
and in organic or biological systems. Finally, some advances, hot topics, new
applications, and open issues are presented, including the effect of external magnetic
fields, nonmagnetic interactions, MFM tips calibration and advanced probes, and
magnetic imaging with variable temperature.