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LEADER: Leakage currents estimation technique for aging degradation aware 16 nm CMOS circuits

pubblicato su: Communications in Computer and Information Science - 2019

Abbas Z., Zahra A., Olivieri M.

Geometry scaling impact on leakage currents in FinFET standard cells based on a logic-level leakage estimation technique

pubblicato su: Lecture Notes in Electrical Engineering - 2018

Abbas Zia, Zahra Andleeb, Olivieri Mauro, Mastrandrea Antonio

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industrial and manufacturing engineering (1) Apply industrial and manufacturing engineering filter
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