Ricerc@Sapienza

The Kaufman source acquired allows varying the proton beam energy from 10 to 1200 eV with a high degree of reproducibility and control. The same applies to the dose of incorporated protons. These very important parameters are typically hard to control by other systems, such as plasma sources or electrochemical methods. Indeed, Kaufman sources are configured to have the region of gas ionization physically separate from the intended target, avoiding exposure of the samples to intense and potentially damaging electric fields.

Correlative microscopy is an approach which benefits from imaging of the same object by different techniques. Correlation between the data, measured by two or more independent methods, can provide a piece of further information about the sample, which could be too complicated to analyze by those methods separately.

PESCA platform consists in the combination of AFM (with nm resolution) with an electrochemical set-up. This combination  affords simultaneous acquisition of different

types of images (topological activity of electrified surface and correlation with applied electrical potential) unveiling fundamental interfacial properties at nm range

The TEM is equipped with high-performance additional packages in order to be not just a 'high resolution electron microscope', but a complete and unique characterization platform able to be a fundamental support for excellence researches in all the different fields of interest for Sapienza.

Unlike most forms of microscopy, XRM can deliver high resolution and contrast in three dimensions, and can do so without destroying samples. Recent advances in XRM technology have come from pioneering work in synchrotron facilities across the world. In these facilities, researchers use brilliant beams of X-rays produced by particle accelerators to achieve unprecedented levels of resolution and contrast.