Pubblicazioni

LEADER: Leakage currents estimation technique for aging degradation aware 16 nm CMOS circuits

2019 - Communications in Computer and Information Science
Abbas, Z.; Zahra, A.; Olivieri, M.

Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations

2016 - JOURNAL OF COMPUTATIONAL ELECTRONICS
Abbas, Zia; Olivieri, Mauro; Ripp, Andreas

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