Pubblicazioni

Manuzzato, E.; Gioscio, E.; Mattei, I.; Mirabelli, R.; Patera, V.; Sarti, A.; Schiavi, A.; Sciubba, A.; Valle, S. M.; Traini, G.; Marafini, M.; Gasparini, L.; Perenzoni, M.; Zou, Y.; Parmesan, L.; Battistoni, G.; De Simoni, M.; Dong, Y.; Fischetti, M.

Growth of nanostructured silicon by microwave/nano-susceptors technique with low substrate temperature

2019 - MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Palma, F.; Cattaruzza, E.; Riello, P.

The MONDO detector prototype development and test: steps towards a SPAD-CMOS based integrated readout (SBAM sensor)

2018 - IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Mirabelli, R.; Gasparini, L.; Magi, M.; Marafini, M.; Pinci, D.; Sarti, A.; Sciubba, A.; Stoppa, D.; Traini, G.; Patera, V.

Study of the performance of an optically r eadout triple-GEM

2018 - IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Marafini, Michela; Patera, Vincenzo; Pinci, Davide; Sarti, Alessio; Sciubba, Adalberto; Torchia, Natalia Maria

A Model of High-Frequency Self-Mixing in Double-Barrier Rectifier

2018 - JOURNAL OF INFRARED, MILLIMETER, AND TERAHERTZ WAVES

Palma, Fabrizio; Rao, R.

Secure double rate registers as an RTL countermeasure against power analysis attacks

2018 - IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS

Bellizia, Davide; Bongiovanni, Simone; MonsurrÃ², Pietro; Scotti, Giuseppe; Trifiletti, Alessandro; Trotta, Francesco Bruno

Characterizing noise pulse effects on the power consumption of idle digital cells

2018 - Proceedings - IEEE International Symposium on Circuits and Systems (ISCAS)

Olivieri, M.; Khalid, U.; Mastrandrea, A.; Menichelli, F.

Solid state rectifier as terahertz detector

2018 - 2018 110th AEIT International Annual Conference, AEIT 2018

Massaioli, S.; Rao, R.; Palma, F.

CMOS compatible, low temperature, growth of silicon nanowires by microwave nano-susceptors

2018 - Proceedings of the IEEE Conference on Nanotechnology

Palma, F.; Cattaruzza, E.; Rao, R.; Riello, P.

ORANGE: A high sensitivity particle tracker based on optically read out GEM

2017 - NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT

Marafini, M.; Patera, Vincenzo; Pinci, Davide; Sarti, Alessio; Sciubba, Adalberto; Spiriti, E.

Fully integrable current-mode feedback suppressor as an analog countermeasure against CPA attacks in 40nm CMOS technology

2017 - PRIME 2017 - 13th Conference on PhD Research in Microelectronics and Electronics, Proceedings

Bellizia, Davide; Scotti, Giuseppe; Trifiletti, Alessandro

Design-oriented models for quick estimation of path delay variability via the fan-out-of-4 metric

2017 - Proceedings - IEEE International Symposium on Circuits and Systems

Alioto, Massimo; Scotti, Giuseppe; Trifiletti, Alessandro

Comparative performance analysis and complementary triode based CMFB circuits for fully differential class AB symmetrical OTAs with low power consumption

2016 - INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS

Centurelli, Francesco; Monsurro', Pietro; Trifiletti, Alessandro

Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations

2016 - JOURNAL OF COMPUTATIONAL ELECTRONICS

Abbas, Zia; Olivieri, Mauro; Ripp, Andreas

Optimal transistor sizing for maximum yield in variation-aware standard cell design

2016 - INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS

Abbas, Zia; Olivieri, Mauro

Implementation of the present-80 block cipher and analysis of its vulnerability to side channel attacks exploiting static power

2016 - Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016

Bellizia, Davide; Scotti, Giuseppe; Trifiletti, Alessandro

On-chip current-mode approach to thwart CPA attacks in CMOS nanometer technology

2016 - INTERNATIONAL JOURNAL OF MICROELECTRONICS AND COMPUTER SCIENCE

Bellizia, Davide; Scotti, Giuseppe; Trifiletti, Alessandro

Optimal NBTI degradation and PVT variation resistant device sizing in a full adder cell

2015 - Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions), 2015 4th International Conference on

ABBAS, ZIA; OLIVIERI, Mauro; KHALID, USMAN; Ripp, Andreas; Pronath, Michael

Variability aware modeling of SEU induced failure probability of logic circuit paths in static conditions

2015 - 2015 4th International Conference on Reliability, Infocom Technologies and Optimization: Trends and Future Directions, ICRITO 2015

Khalid, Usman; Mastrandrea, Antonio; Abbas, Zia; Olivieri, Mauro