Pubblicazioni

A novel framework to estimate the path delay variability on the back of an envelope via the fan-out-of-4s metric

2017 - IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS
Alioto, Massimo; Scotti, Giuseppe; Trifiletti, Alessandro

© Università degli Studi di Roma "La Sapienza" - Piazzale Aldo Moro 5, 00185 Roma