Pubblicazioni

Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations

2016 - JOURNAL OF COMPUTATIONAL ELECTRONICS
Abbas, Zia; Olivieri, Mauro; Ripp, Andreas

Impact of inelastic phonon scattering in the OFF state of Tunnel-field-effect transistors

2016 - JOURNAL OF COMPUTATIONAL ELECTRONICS
Pala, M G; Grillet, C; Cao, J; Logoteta, D; Cresti, A; Esseni, D

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