Scanning Probe Microscopy: Functionalization of Scanning Probe Tips with Epitaxial Semiconductor Layers
A novel nanotechnology approach for the functionalization of scanning probe tips with epitaxial semiconductor material is presented by Michele Ortolani and co-workers in article number 1600033. The epitaxial material is extracted from micropillars by a lift-out process directly with the scanning probe and then it is shaped into a pyramidal tip. In this demonstration, the optical properties of scanning probes functionalized with epitaxial germanium are demonstrated by two different infrared nano-optics experiments.