Scanning Probe Microscopy: Functionalization of Scanning Probe Tips with Epitaxial Semiconductor Layers
01 Pubblicazione su rivista
Giliberti Valeria, Sakat Emilie, Bollani Monica, Altoe M. Virginia, Melli Mauro, Weber Bargioni Alexander, Baldassarre Leonetta, Celebrano Michele, Frigerio Jacopo, Isella Giovanni, Cabrini Stefano, Ortolani Michele
ISSN: 2366-9608
A novel nanotechnology approach for the functionalization of scanning probe tips with epitaxial semiconductor material is presented by Michele Ortolani and co-workers in article number 1600033. The epitaxial material is extracted from micropillars by a lift-out process directly with the scanning probe and then it is shaped into a pyramidal tip. In this demonstration, the optical properties of scanning probes functionalized with epitaxial germanium are demonstrated by two different infrared nano-optics experiments.