Pubblicazioni

Strained Silicon Technology: Non-Destructive High-Lateral-Resolution Characterization Through Tip-Enhanced Raman Spectroscopy

2024 - APPLIED SPECTROSCOPY

LA PENNA, Giancarlo; Mancini, Chiara; Proietti, Anacleto; Buccini, Luca; Passeri, Daniele; Gambacorti, Narciso; Richy, JÃ©rÃ´me; Rossi, Marco

Characterization-oriented design of E-band Variable-Gain Amplifiers in BiCMOS technology

2022 - MMS 22 Mediterranean Microwave Symposium

Amendola, G.; Boccia, L.; Centurelli, F.; Ciccognani, W.; Limiti, E.; Mustacchio, C.; Tommasino, P.; Trifiletti, A.

Compact E-band I/Q receiver in SiGe BiCMOS for 5G backhauling applications

2021 - IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS

Amendola, G.; Boccia, L.; Centurelli, F.; Chevalier, P.; Fonte, A.; Mustacchio, C.; Pallotta, A.; Tommasino, P.; Traversa, A.; Trifiletti, A.

10-GHz fully differential SallenâKey lowpass biquad filters in 55nm SiGe BICMOS technology

2020 - ELECTRONICS

Centurelli, F.; Monsurro, P.; Scotti, G.; Tommasino, P.; Trifiletti, A.

A 10âGHz inductorless active SiGe HBT lowpass filter

2018 - INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING

Centurelli, Francesco; MonsurrÃ², Pietro; Trifiletti, Alessandro

Scanning Probe Microscopy: Functionalization of Scanning Probe Tips with Epitaxial Semiconductor Layers

2017 - SMALL METHODS

Giliberti, Valeria; Sakat, Emilie; Bollani, Monica; Altoe, M. Virginia; Melli, Mauro; Weber Bargioni, Alexander; Baldassarre, Leonetta; Celebrano, Michele; Frigerio, Jacopo; Isella, Giovanni; Cabrini, Stefano; Ortolani, Michele