The availability of methods for the accurate characterization of electric and magnetic properties at the nanoscale is a growing request in the field of nanoscience and nanotechnology. Atomic force microscopy (AFM) is a versatile platform to develop Kelvin probe force microscopy (KPFM) for the mapping of work function (WF) and surface electric charges, and magnetic force microscopy (MFM) for the imaging of magnetic fields at the nanoscale which, despite quite widespread, still suffer from severe limitations in terms of quantitative analysis.
In this project we propose to develop KPFM and MFM methods for the accurate quantitative nanocharacterizations. We will compensate for the lack of probes suitable for both methods and for effective multi-materials calibration samples by optimized microfabrication.
As for KPFM, we will focus on optimization of the sensitivity of WF and electric charges measurement, analyzing also the water layer effect with studies in air and vacuum also via correlative probe electron microscopy (CPEM).
As for MFM, we will address the accurate deletion of electrostatic artifacts which limit nanomagnetic quantifications. Tapping mode MFM will be optimized and torsional resonance MFM (TR-MFM) will be developed, a promising technique not yet popular due to the need for magnetical asymmetric tips not commercially available. Then an innovative mehtod combinig KPFM and TR-MFM will be develped for the ultimate deletion of artifacts and maximization of sensitivity to ultralow magnetic fields.
The methods will be used on samples identified as case study with high scientific and technological impact, i.e., polymeric soft colloids known as stimuli-responsive microgels (MGs) and nanoparticles-MGs hybrids with applications from nonlinear optics and soft matter to nanomedicine and materials science and advanced cathodic materials involved in the recycling of end-of-life Li-ion batteries.
